D2 PHASER
The novel D2 PHASER with XFlash detector represents the first benchtop system offering X-ray diffraction (XRD), energy-dispersive X-ray diffraction (EDXRD) as well as simultaneous X-ray fluorescence (XRF) measurements under ambient conditions. Based on Bruker’s Silicon Drift technology, the XFlash detector features resolution of less than 180 eV (CuKa) at count rate levels of more than 100.000 cps.
Availability: Commercially Available
| Manufacturer |
| Bruker Corporation |
| Product Name |
| D2 PHASER |
| Detection Category |
| Chemical; Explosives |
| Detection Principle |
| Elemental Analysis; |
| Detection Method |
| X-ray Diffraction (XRD); X-ray Fluorescence; |
| Application |
| Laboratory Analysis; Bulk Analysis; |
| Equipment Type |
| Instrument |
| Product Synopsis |
| The novel D2 PHASER with XFlash detector represents the first benchtop system offering X-ray diffraction (XRD), energy-dispersive X-ray diffraction (EDXRD) as well as simultaneous X-ray fluorescence (XRF) measurements under ambient conditions. Based on Bruker’s Silicon Drift technology, the XFlash detector features resolution of less than 180 eV (CuKa) at count rate levels of more than 100.000 cps. |
| Availability |
| Commercially Available |
| Technology Readiness Level (TRL) |
| 9 |
| User Feedback Sources |
| Indifferent/No user feedback |
| Weight |
| >50 Lbs. |
| Noise Produced |
| Negligible |
| Transportability |
| Benchtop/Fixed |
| Operating Conditions |
| 0 to 35°C (32 to 95°F); max. 90% RH |
| Data Analysis Support Equipment |
| PC |
| Communications Interface |
| Yes |
| Other Chemical Targets |
| Elemental range: K to Hf (~3 to 20 keV) |
| Sample Introduction |
| Solid; Liquid |
| Sensitivity/Detection Limits |
| Bulk; (>mg) |
| Response Time (Sample Application To Output) |
| <5 minutes |
| Alarm Capability |
| No |
| Software Control |
| Yes |
| Training Required |
| <1 week training |
| Training Available |
| Yes |
| Manuals Available |
| Yes |
