S4 T-Star
The S4 T-Star is a Total Reflection X-ray fluorescence is a benchtop instrument used for Ultra-Trace analysis.
Availability: Commercially available
Manufacturer |
| Bruker Corporation |
Product Name |
| S4 T-Star |
Detection Category |
| Chemical; Explosives |
Detection Principle |
| Elemental Analysis; |
Detection Method |
| X-Ray Fluorescence; |
Application |
| Laboratory Analysis; Bulk Analysis; |
Equipment Type |
| Instrument |
Product Synopsis |
| The S4 T-Star is a Total Reflection X-ray fluorescence is a benchtop instrument used for Ultra-Trace analysis. |
Availability |
| Commercially available |
Technology Readiness Level (TRL) |
| 9 |
User Feedback Sources |
| Indifferent/No user feedback |
Dimensions |
| 20.8 x 27.3 x 20.2 in (52.8 x 69.3 x 51.2 cm) |
Weight |
| >50 Lbs.; 187.4 Lbs. (85 kg) |
Power Requirements |
| AC/DC Line Power |
Noise Produced |
| Negligible |
Transportability |
| Benchtop/Fixed |
Ruggedness |
| Indoor use only |
Operating Conditions |
| Indoor use only |
Consumables |
| <$1,000/year |
Solvents/Reagents |
| None |
Available Accessories |
| Washing cassette for sample carriers |
Data Analysis Support Equipment |
| Data analysis software |
Expected Operational Life |
| Indefinite |
Shelf Life |
| >5 years |
Other Chemical Targets |
| Elemental Analysis. Mo excitation: elements Mg to U (with exception of Nb to Ru)
W excitation: elements K to U |
Sample Introduction |
| Solid; Liquid |
Sensitivity/Detection Limits |
| ppb; ppm; ng; µg |
Response Time (Sample Application To Output) |
| <15 minutes |
Software Control |
| PC |
Other Operational Parameters |
| Peltier-cooled XFlash® Silicon Drift Detector; 60 mm² active area; Energy resolution < 149 eV at 100 kcps |
Training Required |
| <1 week training |
Training Available |
| Yes |
Manuals Available |
| Yes |
Warranties |
| Yes |